Applications of Photoluminescence Imaging to Dopant and Carrier Concentration Measurements of Silicon Wafers
Author:
Affiliation:
1. Research School of Engineering , The Australian National University (ANU), Canberra, Australia
2. Apollon Solar , Lyon, France
3. Fraunhofer Institut fur Solare Energiesysteme (ISE), Germany
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx5/5503869/6481434/06381427.pdf?arnumber=6381427
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