Impact of Gaussian Grain Boundary Trap States on the Performance of the LTPS TFTs
Author:
Affiliation:
1. Indian Institute of Information Technology,Dept. of Electronics and Communication Engineering,Allahabad,India
2. Tezpur University,Department of ECE,Assam,India
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10032824/10032825/10032858.pdf?arnumber=10032858
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1. Highly Sensitive ZnO Ozone Detectors at Room Temperature
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3. Review of zincblende ZnO: Stability of metastable ZnO phases
4. Investigations on Electronic Behavior and Stability Issues of Zinc Oxide (ZnO) based Thin-Film Transistors (TFTs);kandpal;BITS Pilani,2018
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1. Thin‐Film Transistors for Integrated Circuits: Fundamentals and Recent Progress;Advanced Functional Materials;2023-10-11
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