Abnormal Back Channel Leakage Under Large Drain Voltage in Short Channel Organic Thin-Film Transistors
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Published:2019-11
Issue:11
Volume:40
Page:1752-1755
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ISSN:0741-3106
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Container-title:IEEE Electron Device Letters
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language:
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Short-container-title:IEEE Electron Device Lett.
Author:
Chen Guan-Fu,
Lin Sung-Chun,
Yu Ming-ChangORCID,
Chuang Yao-Chih,
Zhang ShengdongORCID,
Chen Hong-Chih,
Chang Ting-ChangORCID,
Huang Shin-Ping,
Zhou Kuan-Ju,
Chen Jian-Jie,
Kuo Chuan-Wei,
Su Wan-Ching,
Tsao Yu-Ching
Funder
Southern Taiwan Science Park
Ministry of Science and Technology, Taiwan
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials