Influence of the Substrate and Tip Shape on the Characterization of Thin Films by Electrostatic Force Microscopy
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Computer Science Applications
Link
http://xplorestaging.ieee.org/ielx5/7729/6475295/06392286.pdf?arnumber=6392286
Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Unveiling Alternating Current Electronic Properties at Ferroelectric Domain Walls;Advanced Electronic Materials;2021-12-30
2. A Model for the Characterization of the Polarizability of Thin Films Independently of the Thickness of the Film;The Journal of Physical Chemistry B;2017-11-09
3. Feedforward neural network methodology to characterize thin films by Electrostatic Force Microscopy;Ultramicroscopy;2017-11
4. Quantitative analysis of effective height of probes in microwave impedance microscopy;Review of Scientific Instruments;2016-09
5. Quantitative Theory for Probe-Sample Interaction With Inhomogeneous Perturbation in Near-Field Scanning Microwave Microscopy;IEEE Transactions on Microwave Theory and Techniques;2016-05
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