Learning Representation for Clustering Via Prototype Scattering and Positive Sampling-Reference-Cited by-同舟云学术

Learning Representation for Clustering Via Prototype Scattering and Positive Sampling

Published:2023-06-01 Issue:6 Volume:45 Page:7509-7524
ISSN:0162-8828
Container-title:IEEE Transactions on Pattern Analysis and Machine Intelligence
language:
Short-container-title:IEEE Trans. Pattern Anal. Mach. Intell.

Author:

Huang Zhizhong¹^ORCID,Chen Jie¹^ORCID,Zhang Junping¹^ORCID,Shan Hongming²^ORCID

Affiliation:

1. Shanghai Key Lab of Intelligent Information Processing, School of Computer Science, Fudan University, Shanghai, China

2. Key Laboratory of Computational Neuroscience and Brain-Inspired Intelligence, Institute of Science and Technology for Brain-inspired Intelligence, MOE Frontiers Center for Brain Science, Fudan University, Shanghai, China

Funder

National Natural Science Foundation of China

Shanghai Municipal Science and Technology

ZJ Lab

Shanghai Municipal of Science and Technology

Shanghai Sailing Program

Natural Science Foundation of Shanghai

Shanghai Center for Brain Science and Brain-inspired Technology

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Applied Mathematics,Artificial Intelligence,Computational Theory and Mathematics,Computer Vision and Pattern Recognition,Software

Link

http://xplorestaging.ieee.org/ielx7/34/10120646/09926200.pdf?arnumber=9926200

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