Author:
Tan Shin Hwei,Roychoudhury Abhik
Cited by
76 articles.
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1. C2D2: Extracting Critical Changes for Real-World Bugs with Dependency-Sensitive Delta Debugging;Proceedings of the 33rd ACM SIGSOFT International Symposium on Software Testing and Analysis;2024-09-11
2. An empirical study of untangling patterns of two-class dependency cycles;Empirical Software Engineering;2024-03
3. A study of common bug fix patterns in Rust;Empirical Software Engineering;2024-02-12
4. ITER: Iterative Neural Repair for Multi-Location Patches;Proceedings of the IEEE/ACM 46th International Conference on Software Engineering;2024-02-06
5. RAP-Gen: Retrieval-Augmented Patch Generation with CodeT5 for Automatic Program Repair;Proceedings of the 31st ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering;2023-11-30