Efficient Characterization Methodology for Low-Frequency Noise Monitoring
Author:
Affiliation:
1. GlobalFoundries Fab1 LLC & Co.KG,Dresden,Saxony,Germany,01109
2. Fraunhofer-IPMS,Dresden,Saxony,Germany,01109
Funder
Ministry of Economy
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10520250/10520251/10520698.pdf?arnumber=10520698
Reference10 articles.
1. Expanding Human Potential through Imaging and Sensing Technologies
2. Single-charge-based modeling of transistor characteristics fluctuations based on statistical measurement of RTN amplitude;Takeuchi;VLSI,2009
3. Characterization and modeling of low frequency noise in CMOS inverters
4. Area-Efficient and Bias-Flexible Inline Monitoring Structure for Fast Characterization of RTN and Transistor Local Mismatch in Advanced Technologies
5. Improved Analysis of Low Frequency Noise in Field-Effect MOS Transistors
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