Compact expression to model the effects of dielectric absorption on analog-to-digital converters-Reference-Cited by-同舟云学术

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Compact expression to model the effects of dielectric absorption on analog-to-digital converters

Published:2024-04-15 Issue: Volume:3 Page:1-5
ISSN:
Container-title:2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS)
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Author:

Saro Simone¹,Palestri Pierpaolo²,Caruso Enrico³,Toniutti Paolo³,Calabro Rocco³,Terokhin Semen³,Driussi Francesco¹

Affiliation:

1. University of Udine,DPIA,Italy

2. University of Modena and Reggio,Emilia,Italy

3. Infineon Technologies Austria,Villach,Austria

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10520250/10520251/10520681.pdf?arnumber=10520681

Reference8 articles.

1. Electric Polarization and Relaxation

2. A comparative study of dielectric relaxation losses in alternative dielectrics

3. Dielectric absorption of low-k materials: extraction, modelling and influence on SAR ADCs

4. A Capacitor Dielectric Relaxation Effect Cancellation Circuit in a 12-Bit, 1-MSps, 5.0-V SAR ADC on a 28-nm Embedded Flash Memory Microcontroller

5. Dielectric reliability and material properties of Al2O3 in metal insulator metal capacitors (MIMCAP) for RF bipolar technologies in comparison to SiO2, SiN and Ta2O5;Allers;IEEE BCTM,2003

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