Author:
Roy Soham,Stiene Brandon,Millican Spencer K.,Agrawal Vishwani D.
Cited by
12 articles.
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1. A Survey and Recent Advances: Machine Intelligence in Electronic Testing;Journal of Electronic Testing;2024-04
2. Adaptive Reconfigurable LFSR: Dynamic Tapping and Reseeding for Enhanced Pseudo Random Number Generation;2024 IEEE International Students' Conference on Electrical, Electronics and Computer Science (SCEECS);2024-02-24
3. An Amalgamated Testability Measure Derived from Machine Intelligence;2024 37th International Conference on VLSI Design and 2024 23rd International Conference on Embedded Systems (VLSID);2024-01-06
4. Designing a true random number generator using digital clock manager (DCM);INTELLIGENT BIOTECHNOLOGIES OF NATURAL AND SYNTHETIC BIOLOGICALLY ACTIVE SUBSTANCES: XIV Narochanskie Readings;2023
5. Weighted test pattern generator (TPG) for built-in self-test (BIST);LOW RADIOACTIVITY TECHNIQUES 2022 (LRT 2022): Proceedings of the 8th International Workshop on Low Radioactivity Techniques;2023