Advanced Accelerated Power Cycling Test for Reliability Investigation of Power Device Modules-Reference-Cited by-同舟云学术

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Advanced Accelerated Power Cycling Test for Reliability Investigation of Power Device Modules

Published:2016 Issue: Volume: Page:1-1
ISSN:0885-8993
Container-title:IEEE Transactions on Power Electronics
language:
Short-container-title:IEEE Trans. Power Electron.

Author:

Choi Ui-Min,Joergensen Soeren,Blaabjerg Frede

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx7/63/4359240/7434029.pdf?arnumber=7434029

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