Spring Wheat Yield Estimates from Spectral Reflectance Measurements-Reference-Cited by-同舟云学术

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Spring Wheat Yield Estimates from Spectral Reflectance Measurements

Published:1981-04 Issue:2 Volume:GE-19 Page:78-84
ISSN:0196-2892
Container-title:IEEE Transactions on Geoscience and Remote Sensing
language:
Short-container-title:IEEE Trans. Geosci. Remote Sensing

Author:

Aase J. Kristian,Siddoway F. H.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

General Earth and Planetary Sciences,Electrical and Electronic Engineering

Link

http://xplorestaging.ieee.org/ielx5/36/4157213/04157217.pdf?arnumber=4157217

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