Single Event Upset Characterization of the Virtex-6 Field Programmable Gate Array Using Proton Irradiation-Reference-Cited by-同舟云学术

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Single Event Upset Characterization of the Virtex-6 Field Programmable Gate Array Using Proton Irradiation

Published:2012-07 Issue: Volume: Page:
ISSN:
Container-title:2012 IEEE Radiation Effects Data Workshop
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Author:

Hiemstra David M.,Kirischian Valeri

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/6353295/6353706/06353716.pdf?arnumber=6353716

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. A Framework for Evaluating and Optimizing FPGA-Based SoCs for Aerospace Computing;ACM Transactions on Reconfigurable Technology and Systems;2016-12-28

4. Experimental study on heavy ion single-event effects in flash-based FPGAs;Nuclear Science and Techniques;2016-02

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