MOSRA: An efficient and versatile MOS aging modeling and reliability analysis solution for 45nm and below-Reference-Cited by-同舟云学术

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MOSRA: An efficient and versatile MOS aging modeling and reliability analysis solution for 45nm and below

Published:2010-11 Issue: Volume: Page:
ISSN:
Container-title:2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology
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Author:

Tudor Bogdan,Wang Joddy,Sun Charly,Chen Zhaoping,Liao Zhijia,Tan Robin,Liu Weidong,Lee Frank

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx5/5658734/5667273/05667399.pdf?arnumber=5667399

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