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A Precision Mismatch Measurement Technique for Integrated Capacitor Array Using a Switched Capacitor Amplifier

  • Published:2013-05 Issue:2 Volume:26 Page:226-232
  • ISSN:0894-6507
  • Container-title:IEEE Transactions on Semiconductor Manufacturing
  • language:
  • Short-container-title:IEEE Trans. Semicond. Manufact.

Author:

Kwon Young-Cheon,Kwon Oh-Kyong

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Impedance Measurement Platform for Statistical Capacitance and Current Characteristic Measurements of Arrayed Cells with Atto-order Precision;2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS);2024-04-15

2. A dynamic‐range self‐compensation technique in a noise shaping SAR ADC utilizing mismatch error shaping;Electronics Letters;2022-04-04

3. Deterministic Dither Based Mismatch Characterization of Wide Range of Metal-Oxide-Metal Capacitors;2020 IEEE 63rd International Midwest Symposium on Circuits and Systems (MWSCAS);2020-08

4. Enhancement of touch screen sensing based on voltage shifting differential offset compensation;Analog Integrated Circuits and Signal Processing;2017-12-04

5. High-Precision, Mixed-Signal Mismatch Measurement of Metal–Oxide–Metal Capacitors;IEEE Transactions on Circuits and Systems II: Express Briefs;2017-11
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