Substrate-Induced Noise Model and Parameter Extraction for High-Frequency Noise Modeling of Sub-Micron MOSFETs-Reference-Cited by-同舟云学术

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Substrate-Induced Noise Model and Parameter Extraction for High-Frequency Noise Modeling of Sub-Micron MOSFETs

Published:2014-09 Issue:9 Volume:62 Page:1973-1985
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Ong S. N.,Yeo K. S.,Chew K. W. J.,Chan L. H. K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx7/22/6888537/06872600.pdf?arnumber=6872600

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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4. On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits;2020

5. Noise Robustness of Body Built-In Sensors;On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits;2019-10-01

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