Broadband Time-Domain Measurement System for the Characterization of Nonlinear Microwave Devices With Memory-Reference-Cited by-同舟云学术

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Broadband Time-Domain Measurement System for the Characterization of Nonlinear Microwave Devices With Memory

Published:2010-04 Issue:4 Volume:58 Page:1038-1045
ISSN:0018-9480
Container-title:IEEE Transactions on Microwave Theory and Techniques
language:
Short-container-title:IEEE Trans. Microwave Theory Techn.

Author:

Abouchahine Mouhamad,Saleh Alaa,Neveux Guillaume,Reveyrand Tibault,Teyssier Jean-Pierre,Rousset Danielle,Barataud Denis,Nebus Jean-Michel

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Radiation

Link

http://xplorestaging.ieee.org/ielx5/22/5446455/05428787.pdf?arnumber=5428787

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications;2022 IEEE International Reliability Physics Symposium (IRPS);2022-03

2. Measurement and Modeling for RF Amplifier Based on Carrier Waveform Distortion in Time Domain;2016 3rd International Conference on Information Science and Control Engineering (ICISCE);2016-07

3. 4-Channel, time-domain measurement system using track and hold amplifier for the characterization and linearization of high-power amplifiers;International Journal of Microwave and Wireless Technologies;2011-11-17

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