IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices-Reference-Cited by-同舟云学术

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IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices

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IEEE

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http://xplorestaging.ieee.org/ielx5/6152111/6152112/06152113.pdf?arnumber=6152113

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. ADC Dynamic Parameter Testing Scheme Under Relaxed Conditions;Journal of Electronic Testing;2024-07-17

2. Calibrated Sinefit Based on Quantized Data;2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC);2024-05-20

3. Review: Parametric Variations in Analog-to-Digital Converters Using Different CMOS Technologies;Proceedings of International Conference on Communication and Artificial Intelligence;2021

4. Two-Phase Resource Queueing System with Requests Duplication and Renewal Arrival Process;Distributed Computer and Communication Networks;2020

5. Level-crossing ADC design and evaluation methodology for normal and pathological electrocardiogram signals measurement;Measurement;2018-08

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