Author:
Pang Yon-Sup,Park Sung-Bum,Hwang Leeyeun,Lee Taejong
Cited by
1 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Low Frequency Noise and Hot Carrier Degradation Characteristics on 55nm LP Platform;2024 Conference of Science and Technology for Integrated Circuits (CSTIC);2024-03-17