A Metastability Inference and Avoidance Technique for Near-Threshold-Voltage Network-on-Chip
Author:
Affiliation:
1. Shanghai Jiao Tong University,Department of Micro-Nano Electronics,Shanghai,China
2. National University of Defense Technology,Artificial Intelligence Research Center,Beijing,China
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/10181241/10181318/10181952.pdf?arnumber=10181952
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4. Comparative analysis and study of metastability on high-performance flip-flops
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