Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques-Reference-Cited by-同舟云学术

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Practical Simulation Flow for Evaluating Analog/Mixed-Signal Test Techniques

Published:2016-12 Issue:6 Volume:33 Page:46-54
ISSN:2168-2356
Container-title:IEEE Design & Test
language:
Short-container-title:IEEE Des. Test

Author:

Barragan Manuel J.,Stratigopoulos Haralampos-G.,Mir Salvador,Le-Gall Herve,Bhargava Neha,Bal Ankur

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/6221038/7604039/07511721.pdf?arnumber=7511721

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A Survey and Recent Advances: Machine Intelligence in Electronic Testing;Journal of Electronic Testing;2024-04

2. Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers;IEEE Open Journal of Circuits and Systems;2023

3. Machine Learning Support for Diagnosis of Analog Circuits;Machine Learning Support for Fault Diagnosis of System-on-Chip;2022-10-22

4. Functional Testing of On-chip Analog/RF Circuits using Machine Learning based Regression Models;2022 IEEE International Test Conference India (ITC India);2022-07-24

5. SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety;IEEE Transactions on Circuits and Systems I: Regular Papers;2021-06

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