Testing for MOS IC Failure Modes-Reference-Cited by-同舟云学术

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Testing for MOS IC Failure Modes

Published:1982-04 Issue:1 Volume:R-31 Page:9-18
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:
Short-container-title:IEEE Trans. Rel.

Author:

Edwards David G.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx5/24/5221203/05221212.pdf?arnumber=5221212

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