An Intrinsic and Database-Free Authentication by Exploiting Process Variation in Back-End Capacitors

Author:

Shylendra AhishORCID,Bhunia SwarupORCID,Trivedi Amit Ranjan

Funder

Semiconductor Research Corporation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Novel Device Fingerprinting Sensor Leveraging Back-End-of-Line Resistance and Capacitance;2024 19th Conference on Ph.D Research in Microelectronics and Electronics (PRIME);2024-06-09

2. Unifying Intrinsically-Operated Physically Unclonable Function and Random Number Generation in Analog Circuits: A Case Study on Successive Approximation ADC;2023 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems (VLSID);2023-01

3. A Physically Unclonable Function Embedded in a SAR ADC;2022 IEEE International Test Conference in Asia (ITC-Asia);2022-08

4. On Database-Free Authentication of Microelectronic Components;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-01

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