Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure-Reference-Cited by-同舟云学术

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Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure

Published:2017-04 Issue:4 Volume:25 Page:1397-1407
ISSN:1063-8210
Container-title:IEEE Transactions on Very Large Scale Integration (VLSI) Systems
language:
Short-container-title:IEEE Trans. VLSI Syst.

Author:

Tenentes Vasileios^ORCID,Rossi Daniele,Yang Sheng,Khursheed Saqib,Al-Hashimi Bashir M.,Gunn Steve R.

Funder

EPSRC U.K.

Department of Electrical Engineering and Electronics University of Liverpool U.K.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Hardware and Architecture,Software

Link

http://xplorestaging.ieee.org/ielx7/92/7882729/07765116.pdf?arnumber=7765116

Cited by 14 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Functionally Possible Path Delay Faults With High Functional Switching Activity;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2024

3. Run-Time Thermal Management for Lifetime Optimization in Low-Power Designs;Electronics;2022-01-29

4. Differential Aging Sensor Using Subthreshold Leakage Current to Detect Recycled ICs;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2021-12

5. A Support Vector Regression based Machine Learning method for on-chip Aging Estimation;2021 4th International Conference on Computing & Information Sciences (ICCIS);2021-11-29

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