Exploring the Spectrum of Analytical Techniques for Material Characterization

Abstract

Imaging spectroscopy integrates the spatial information of a measured sample with its chemical or physical information, enabling comprehensive material characterization and analysis. This tutorial delves into the intricacies of various imaging spectroscopy methods, which apply to multiple spectroscopic regions. Imaging spectroscopy may be accomplished for ultraviolet-visible (UV-vis), fluorescence (FL), near-infrared (NIR), infrared (IR), terahertz (THz), Raman, X-ray fluorescence (XRF), inductively coupled plasma mass spectrometry (ICP-MS), or laser-induced breakdown spectroscopy (LIBS). Measurement data from a single spectral region or multiple spectral regions may be used. Measured spectral data may be analyzed separately or fused into a continuous measurement vector (spectrum) before information processing. For the sampled area, spectral data may be collected from a point, small region, or wide-field. The principles, applications, advantages, and limitations of spectroscopic imaging are discussed here, enabling researchers to have a more comprehensive understanding of the use of spectroscopic imaging for measuring a variety of sample types.