X-RAY RAMAN SCATTERING FROM LOW Z MATERIALS

Abstract

X-ray Raman scattering from core electrons of low Z materials provides an alternative to soft X-ray absorption spectroscopy in cases where (i) exotic final states will be probed, (ii) the penetrating power of hard X rays is needed to study bulk properties, and (iii) when systems under high pressure are studied. The theoretical background and experimental requirements are discussed. The present capabilities of the technique are illustrated by two experiments, performed on the inelastic X ray scattering beamlines at the European Synchrotron Radiation Facility.