NEW MEASURES OF THE QUALITY AND OF THE RELIABILITY OF FITS APPLIED TO FORWARD HADRONIC DATA AT T = 0-Reference-Cited by-同舟云学术

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NEW MEASURES OF THE QUALITY AND OF THE RELIABILITY OF FITS APPLIED TO FORWARD HADRONIC DATA AT T = 0

Published:2002-04 Issue: Volume: Page:
ISSN:
Container-title:Non-Perturbative QCD
language:
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Author:

CUDELL J.R.¹,KANG K.²,EZHELA V.V.³,KUYANOV YU.V.³,LUGOVSKY S.B.³,TKACHENKO N.P.³,GAURON P.⁴,NICOLESCU B.⁴,

Affiliation:

1. Inst. de Physique, Bât. B5, Univ. de Liège, Sart Tilman, B4000 Liège, Belgium

2. Physics Department, Brown University, Providence, RI, U.S.A.

3. COMPAS group, IHEP, Protvino, Russia

4. LPTPE, Université Pierre et Marie Curie, Tour 12 E3, 4 Place Jussieu, 75252, Paris Cedex 05, France

Publisher

WORLD SCIENTIFIC

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Overview of the Compete Program;DIFFRACTION 2002: Interpretation of the New Diffractive Phenomena in Quantum Chromodynamics and in the S-Matrix Theory;2003

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