STRUCTURAL ANALYSIS AND LIFETIME DISTRIBUTION OF ELECTRIC CARRIERS IN CdSe EPITAXIAL LAYERS

Abstract

X-ray diffraction and scanning microscopy were used to analyze the structure of CdSe epitaxial layers. The structural data indicate the growth from CdSe layers of crystallites corresponding to the hexagonal modification. The lifetime distribution of electric carriers investigated by photoconductive frequency-resolved spectroscopy allows for the appreciation of the carrier kinetics in the studied semiconducting layers.