EVIDENCE OF THICKNESS-DEPENDENT STABILITY OF NANOMETER RANGE W/Ni MULTILAYERS AGAINST SWIFT HEAVY ION IRRADIATION

Abstract

We report microstructural characterization studies, including cross-sectional TEM, carried out on pristine and swift heavy ion irradiated W / Ni multilayers with different bilayer thicknesses. Our results very clearly show a strong thickness dependence of the SHI effect; thinner Ni -layers get severely affected while the thicker ones remain intact. This has been confirmed using a multilayer having composite bilayer thickness. This result appears to indicate toward the possible electron conferment and its implication on the dissipation of electronic excitation in metals.