An Attribute np Control Chart for Monitoring Mean Life Using Multiple Deferred State Sampling Based on Truncated Life Tests

Abstract

In this paper, we design an attribute [Formula: see text] control chart for monitoring the mean life of the product where the lifetime follows the Pareto distribution of the second kind. The lifetime of the product is determined by time truncated life test and the multiple deferred state sampling is used to declare the status of the manufacturing process. Control limit coefficients and multiple deferred state sampling parameters such as sample size and number of successive subgroups required to declare the state of the process are determined such that the in-control average run length is as near as possible to the target average run length. Out-of-control average run lengths are calculated for the determined parameters using various shift constants. The performance of the chart is compared with other existing chart in terms of average run length.