Affiliation:
1. Department of Physics, Himeji Institute of Technology, Japan
Abstract
K, L, and M X-rays in the wavelengths between 6Å and 130Å generated by the bombardment of 200 keV protons and other heavy ions were measured by means of a wavelength dispersive Bragg’s spectrometer. The X-ray peak intensity was fairly high in general, while the background was very low. The technique was favorably applied to a practical analysis of several light elements (Be, B, C, N, O, and F). Use of moderate-energy heavy ions considering the wavelength selectivity in X-ray generation was effective for the element analysis. The high-resolution spectrometry in the analytical application of ion-induced X-ray generation was found to be useful for the study of fine electronic structure, e.g. satellite and hypersatellite X-ray study, and of the chemical state of materials.
Publisher
World Scientific Pub Co Pte Lt
Cited by
8 articles.
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1. WDX-PIXE analysis of low energy X-rays using a microbeam;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-04
2. High-resolution PIXE instrumentation survey. Part II;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1999-04
3. MICRO WDX-PIXE SYSTEM AND ITS APPLICATION TO CHEMICAL STATE ANALYSIS;International Journal of PIXE;1999-01
4. High energy resolution PIXE analysis using focused MeV heavy ion beams;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1998-03
5. High energy resolution PIXE with high efficiency using the heavy ion microbeam;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;1997-07