CHARACTERIZATION OF OFFSET PRINTING INK TAGGED WITH RARE-EARTH TAGGANTS BY X-RAY EMISSION TECHNIQUES

Abstract

Proton Induced X-ray Emission (PIXE) and Energy Dispersive X-ray Fluorescence (EDXRF) techniques have been used for elemental characterization of offset printing ink tagged with rare-earth taggants. The offset printing ink was tagged with rare-earth ( La , Pr , Nd , Sm , Eu and Gd ) thenoyltrifluoroacetonate chelates at about 1000-ppm level for each element separately. Small aliquots (approximately 20 mg) of tagged inks were coated on paper supports in the form of small circles having diameter 10–15 mm each and then analyzed. In the case of PIXE, a proton beam of energy 4 MeV and in the case of EDXRF a radioisotope source of 241 Am (100 mCi ) was used to excite the samples. The PIXE analysis showed well-resolved rare-earth L X-rays and EDXRF analysis showed the K X-rays of rare earths. Satisfactory results to identify and quantify the taggants were achieved.