Affiliation:
1. Department of ECE, Haldia Institute of Technology, Haldia, Purba Medinipur, 721657, West Bengal, India
Abstract
Recently, there have been continuous rising interests of multi-bit error correction codes (ECCs) for protecting memory cells from soft errors which may also enhance the reliability of memory systems. The single error correction and double error detection (SEC-DED) codes are generally employed in many high-speed memory systems. In this paper, Hsiao-based SEC-DED codes are optimized based on two proposed optimization algorithms employed in parity check matrix and error correction logic. Theoretical area complexity of SEC-DED codecs require maximum 49.29%, 18.64% and 49.21% lesser compared to the Hsiao codes [M. Y. Hsiao, A class of optimal minimum odd-weight-column SEC-DED codes, IBM J. Res. Dev. 14 (1970) 395–401], Reviriego et al. codes [P. Reviriego, S. Pontarelli, J. A. Maestro and M. Ottavi, A method to construct low delay single error correction codes for protecting data bits only, IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 32 (2013) 479–483] and Liu et al. codes [S. Liu, P. Reviriego, L. Xiao and J. A. Maestro, A method to recover critical bits under a double error in SEC-DED protected memories, Microelectron. Reliab. 73 (2017) 92–96], respectively. Proposed codec is designed and implemented both in field programmable gate array (FPGA) and ASIC platforms. The synthesized SEC-DED codecs need 31.14% lesser LUTs than the original Hsiao code. Optimized codec is faster than the existing related codec without affecting its power consumption. These compact and faster SEC-DED codecs are employed in cache memory to enhance the reliability.
Publisher
World Scientific Pub Co Pte Lt
Subject
Electrical and Electronic Engineering,Hardware and Architecture,Electrical and Electronic Engineering,Hardware and Architecture
Cited by
3 articles.
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