MONITORING MACHINING PROCESSES BASED ON DISCRETE WAVELET TRANSFORM AND STATISTICAL PROCESS CONTROL
Author:
Affiliation:
1. CERCIA, School of Computer Science, The University of Birmingham, Edgbaston, Birmingham, B15 2TT, UK
2. Department of Automation & Computer-Aided-Engineering, The Chinese University of Hong Kong, Shatin, N.T., Hong Kong, China
Abstract
Publisher
World Scientific Pub Co Pte Lt
Subject
Applied Mathematics,Information Systems,Signal Processing
Link
https://www.worldscientific.com/doi/pdf/10.1142/S0219691304000548
Reference12 articles.
1. Combined Shewhart-CUSUM Quality Control Schemes
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4. The wavelet transform, time-frequency localization and signal analysis
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