Bayesian Analysis of the Sequential Inspection Plan via the Gibbs Sampler
Author:
Publisher
Institute for Operations Research and the Management Sciences (INFORMS)
Subject
Management Science and Operations Research,Computer Science Applications
Link
https://pubsonline.informs.org/doi/pdf/10.1287/opre.1070.0501
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1. Bayesian capture-recapture methods for error detection and estimation of population size: Heterogeneity and dependence
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4. Estimating the number of defects under imperfect inspection
5. Sequential Defect Removal Sampling
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