Introducing a Dynamic Reconstruction Methodology for Multilayered Structures in Atom Probe Tomography

Author:

Hatzoglou Constantinos12ORCID,Da Costa Gérald1,Wells Peter3,Ren Xiaochen3ORCID,Geiser Brian P4,Larson David J4ORCID,Demoulin Remi1,Hunnestad Kasper2ORCID,Talbot Etienne1,Mazumder Baishakhi5,Meier Dennis2,Vurpillot François1

Affiliation:

1. INSA Rouen Normandie, CNRS, Groupe de Physique des Matériaux UMR 6634, Univ Rouen Normandie , INSA Rouen Normandie, CNRS, Groupe de Physique des Matériaux UMR 6634, Rouen F-76000 , France

2. Department of Materials Science and Engineering, NTNU, Norwegian University of Science and Technology , Trondheim 7491 , Norway

3. Intel Corporation , Hillsboro, OR 97124 , USA

4. CAMECA Instruments Inc. , 5470 Nobel Dr., Madison, WI 53711 , USA

5. Department of Material Design and Innovation, University at Buffalo , Buffalo, NY 14260 , USA

Abstract

Abstract Atom probe tomography (APT) is a powerful three-dimensional nanoanalyzing microscopy technique considered key in modern materials science. However, progress in the spatial reconstruction of APT data has been rather limited since the first implementation of the protocol proposed by Bas et al. in 1995. This paper proposes a simple semianalytical approach to reconstruct multilayered structures, i.e., two or more different compounds stacked perpendicular to the analysis direction. Using a field evaporation model, the general dynamic evolution of parameters involved in the reconstruction of this type of structure is estimated. Some experimental reconstructions of different structures through the implementation of this method that dynamically accommodates variations in the tomographic reconstruction parameters are presented. It is shown both experimentally and theoretically that the depth accuracy of reconstructed APT images is improved using this method. The method requires few parameters in order to be easily usable and substantially improves atom probe tomographic reconstructions of multilayered structures.

Publisher

Oxford University Press (OUP)

Subject

Instrumentation

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