Atomic-resolution spectroscopic imaging: past, present and future
Author:
Publisher
Oxford University Press (OUP)
Subject
Instrumentation
Link
http://academic.oup.com/jmicro/article-pdf/58/3/87/5853258/dfn030.pdf
Reference67 articles.
1. A scanning microscope with 5 Å resolution
2. Inelastic scattering probabilities in scanning transmission electron microscopy
3. Spectroscopic Imaging of Single Atoms Within a Bulk Solid
4. Depth sectioning with the aberration-corrected scanning transmission electron microscope
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