Correcting the linear and nonlinear distortions for atomically resolved STEM spectrum and diffraction imaging-Reference-Cited by-同舟云学术

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Correcting the linear and nonlinear distortions for atomically resolved STEM spectrum and diffraction imaging

Published:2018-01-29 Issue:suppl_1 Volume:67 Page:i114-i122
ISSN:2050-5698
Container-title:Microscopy
language:en
Short-container-title:

Author:

Wang Yi¹,Suyolcu Y Eren¹,Salzberger Ute¹,Hahn Kersten¹,Srot Vesna¹,Sigle Wilfried¹,van Aken Peter A¹

Affiliation:

1. Stuttgart Center for Electron Microscopy, Max Planck Institute for Solid State Research, Stuttgart, Germany

Publisher

Oxford University Press (OUP)

Subject

Radiology, Nuclear Medicine and imaging,Instrumentation,Structural Biology

Link

http://academic.oup.com/jmicro/article-pdf/67/suppl_1/i114/26055210/dfy002.pdf

Reference33 articles.

1. Spectrum-image: the next step in EELS digital acquisition and processing;Jeanguillaume;Ultramicroscopy,1989

2. Recording and using 4D-STEM datasets in materials science;Ophus;Microsc. Microanal.,2014

3. Atomic-resolution spectroscopic imaging: past, present and future;Pennycook;J. Electron Microsc. (Tokyo),2009

4. 4D STEM: high efficiency phase contrast imaging using a fast pixelated detector;Yang;J. Phys. Conf. Ser.,2015

5. Local crystal structure analysis with several picometer precision using scanning transmission electron microscopy;Kimoto;Ultramicroscopy,2010

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1. Atomic Resolution Cryogenic 4D-STEM Imaging via Robust Distortion Correction;ACS Nano;2023-06-09

2. Quasi-one-dimensional Mn6Bi5 and its electronic structure;Applied Physics Letters;2023-02-20

3. Measurement and correction of TEM image distortion using arbitrary samples;Microscopy;2023-02-14

4. Improving STEM scale calibration reliability with scanning noise correction and image registration;2022-10-17

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