Field and Structure Imaging by Magnetic-field-free Atomic Resolution Scanning Transmission Electron Microscopy-Reference-Cited by-同舟云学术

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Field and Structure Imaging by Magnetic-field-free Atomic Resolution Scanning Transmission Electron Microscopy

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Shibata Naoya¹²³

Affiliation:

1. Institute of Engineering Innovation, The University of Tokyo , Tokyo , Japan

2. Nanostructures Research Laboratory, Japan Fine Ceramic Center , Nagoya , Japan

3. Quantum-Phase Electronics Center (QPEC), The University of Tokyo , Tokyo , Japan

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.676/58638686/ozae044.676.pdf

Reference6 articles.

1. Atomic resolution electron microscopy in a magnetic field free environment

2. Incommensurate grain-boundary atomic structure

3. Development of tilt-scan system for differential phase contrast scanning transmission electron microscopy

4. Real-space observation of a two-dimensional electron gas at semiconductor heterointerfaces

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