In Situ Heating Technique with the FIB-TEM Compatible MEMS Specimen Holder

Author:

Yaguchi Toshie1,Wakui Akiko2,Ito Katsuji2,Asakura Hiroyuki1,Nagakubo Yasuhira1,Li Meng34,Shan Zhiwei3

Affiliation:

1. Electron Microscope Systems Design Dept., Hitachi High-Tech Corporation , Hitachinaka, Ibaraki , Japan

2. Solution Development Dept., Hitachi High-Tech Corporation , Hitachinaka, Ibaraki , Japan

3. Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano) & XJTU-HHT Research and Development Center (XHRDC), State Key Laboratory for Mechanical Behavior of Materials, Xi’an Jiaotong University , Xi’an, Shaanxi , China

4. Center for Functional Nanomaterials, Brookhaven National Laboratory , Upton, NY , United States

Publisher

Oxford University Press (OUP)

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3