Atomically Resolved Secondary Electron Imaging for Bulk Materials-Reference-Cited by-同舟云学术

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Atomically Resolved Secondary Electron Imaging for Bulk Materials

Published:2024-07 Issue:Supplement_1 Volume:30 Page:
ISSN:1431-9276
Container-title:Microscopy and Microanalysis
language:en
Short-container-title:

Author:

Hwang Sooyeon¹,Wu Lijun²,Kisslinger Kim¹,Yang Judith¹,Egerton Ray³,Zhu Yimei²

Affiliation:

1. Center for Functional Nanomaterials, Brookhaven National Laboratory , Upton, NY , United States

2. Condensed Matter Physics and Materials Science Department, Brookhaven National Laboratory , Upton, NY , United States

3. Physics Department, University of Alberta , Edmonton, AB , Canada

Publisher

Oxford University Press (OUP)

Link

https://academic.oup.com/mam/article-pdf/30/Supplement_1/ozae044.133/58672749/ozae044.133.pdf

Reference4 articles.

1. Imaging single atoms using secondary electrons with an aberration-corrected electron microscope

2. Atomic imaging using secondary electrons in a scanning transmission electron microscope: Experimental observations and possible mechanisms

3. Surface determination through atomically resolved secondary-electron imaging

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