Author:
Fernandes Ana C.,Morlat Tomoko A.,Felizardo Miguel,Kling Andreas,Martins Raul C.,Marques José G.,Ramos Ana R.,Lázaro Ignácio,Girard Thomas A.,Lesea Austin
Reference21 articles.
1. Kobayashi H., Kawamoto N., Kase J., et al., Proc. 2009 IEEE Intl. Reliability Physics Symp., 206 (2009)
2. Wen S.J., Wong R., Romain M., et al., Proc. 2010 IEEE Intl. Reliability Physics Symp., 1036 (2010)
3. Thermal Neutron-Induced Soft Errors in Advanced Memory and Logic Devices
4. Qualification Methodology for Sub-Micron ICs at the Low Noise Underground Laboratory of Rustrel
5. International SEMATECH Technology Transfer #01054118A-XFR (2001); #03024377A-TR (2003)
Cited by
5 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献