Evaluation of small scattering defects densities by laser scattering tomography: application to levitated glasses-Reference-Cited by-同舟云学术

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Evaluation of small scattering defects densities by laser scattering tomography: application to levitated glasses

Published:2004-07 Issue:1-3 Volume:27 Page:399-401
ISSN:1286-0042
Container-title:The European Physical Journal Applied Physics
language:
Short-container-title:Eur. Phys. J. Appl. Phys.

Author:

Gall-Borrut P.,Perret D.,Drevet B.,Falgayrettes P.,Nativel L.,Castagne M.

Publisher

EDP Sciences

Subject

Condensed Matter Physics,Instrumentation,Electronic, Optical and Magnetic Materials

Link

http://epjap.epj.org/10.1051/epjap:2004070/pdf

Reference12 articles.

1. J. P. Fillard, P. Gall, J. Bonnafe, M. Castagne, T. Ogawa, Semicond. Sci. Technol.7,

2. Microtomography observation of precipitates in semi‐insulating GaAs materials

3. P. Gall, E. Baudry, J. Bonnafé, M. Castagne, InP and related compounds, Paris,IEEE Lasers and Electro Optics Society (1993), 73

4. Qualification by optical means of CdTe substrates

5. J. Granier, C. Potard,Proc. 6th Eur. Symp. Materials Sciences Microgravity Conditions, ESA Symp. SeriesSP-256, 421 (1987)

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