Analysis of EXELFS modulations in EELS above the K-shell of silicon at 1 MeV in the HVEM-Reference-Cited by-同舟云学术

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Analysis of EXELFS modulations in EELS above the K-shell of silicon at 1 MeV in the HVEM

Published:1990 Issue:1 Volume:1 Page:55-67
ISSN:1154-2799
Container-title:Microscopy Microanalysis Microstructures
language:
Short-container-title:Microsc. Microanal. Microstruct.

Author:

Garg Raj Kumar,Claverie Alain,Balossier Gérard

Publisher

EDP Sciences

Subject

Instrumentation

Link

http://mmm.edpsciences.org/10.1051/mmm:019900010105500/pdf

Reference18 articles.

1. New Technique for Investigating Noncrystalline Structures: Fourier Analysis of the Extended X-Ray—Absorption Fine Structure

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Determining the Volume Expansion at Grain Boundaries Using Extended Energy-Loss Fine Structure Analysis;Microscopy and Microanalysis;2019-08-13

2. EXELFS Analysis of Lattice Structure of Uranium Dioxide;Acta Physico-Chimica Sinica;2017

3. In-situextended energy-loss fine structure analysis of the solid and liquid phases in sub-micron Al particles;Journal of Applied Physics;2011-11-15

4. Contamination and the quantitative exploitation of EELS low-loss experiments;Ultramicroscopy;2001-08

5. Recent evolution of HVEM in France;Ultramicroscopy;1991-11

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