Spatially resolved electron energy-loss near-edge structure analysis of a near Σ = 11 tilt boundary in sapphire
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Published:1993
Issue:1
Volume:4
Page:23-39
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ISSN:1154-2799
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Container-title:Microscopy Microanalysis Microstructures
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language:
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Short-container-title:Microsc. Microanal. Microstruct.
Cited by
78 articles.
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