Microscope imaging by time-of-flight secondary ion mass spectrometry-Reference-Cited by-同舟云学术

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Microscope imaging by time-of-flight secondary ion mass spectrometry

Published:1992 Issue:2-3 Volume:3 Page:119-139
ISSN:1154-2799
Container-title:Microscopy Microanalysis Microstructures
language:
Short-container-title:Microsc. Microanal. Microstruct.

Author:

Schueler Bruno W.

Publisher

EDP Sciences

Subject

Instrumentation

Link

http://mmm.edpsciences.org/10.1051/mmm:0199200302-3011900/pdf

Reference23 articles.

1. A time-of-flight secondary ion microscope

2. A Q-value for energy-focused, time-of-flight spectrometers

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3. Development of High Throughput Microscope Mode Secondary Ion Mass Spectrometry Imaging;Journal of the American Society for Mass Spectrometry;2023-06-15

4. Ion Microscope Imaging Mass Spectrometry Using a Timepix3-Based Optical Camera;Journal of the American Society for Mass Spectrometry;2022-11-16

5. Time‐of‐flight secondary ion mass spectrometric analysis of polymer surfaces: A review;Journal of Applied Polymer Science;2022-03-04

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