Microanalyse et microscopie photoélectroniques X: principe et performances prévisibles

Author:

Cazaux J.

Publisher

EDP Sciences

Cited by 28 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Excitation of XPS spectra from nanoscaled particles by local generation of x-rays;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2015-09

2. XPS analysis of small particles by proximal X-ray generation;Surface and Interface Analysis;2014-03-18

3. Scanning X-ray microfluorescence in a SEM for the analysis of very thin overlayers;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2007-07

4. Comparison of back-foil SXRF and EPMA for the elemental characterization of thin coatings;Vacuum;2005-03

5. New improvements in energy and spatial (x, y, z) resolution in AES and XPS applications;Journal of Electron Spectroscopy and Related Phenomena;2005-01

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