Study of Temperature Dependent Dielectric Spectroscopy of Cerium Doped Bismuth Calcium Cobaltite

Abstract

Bulk specimens of Bi2Ca2-xCexCoO6 (x = 0.00, 0.20) were prepared in pure phase form using co-precipitation method. The monoclinic structure of all samples is revealed via X-Ray Diffraction (XRD) analysis. The crystallite size, lattice constant, lattice strain, and volume of the unit cell were all determined using XRD analysis. On sintered at 750°C for 2 hours, the average crystallite size was 32-38nm. The precision analyzer was used to determine the loss tangent tan (δ), dielectric constant (ε'), AC conductivity (σac) in the 20Hz-3MHz range. The conduction process of electrical conductivity was also investigated utilizing the Jonscher Power Law.