Abstract
We present here a method for measuring the temporal Bakehausen scaling exponent in a two-dimensional thin film. The scaling exponent with long-range interaction is observed to be consistent with theoretical and experimental results. In addition, we demonstrate the characteristic exponent with short-range interaction. Our method contributes to the understanding of DW dynamics and helps to optimize spintronic devices.
Publisher
Trans Tech Publications, Ltd.
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science