Progress and Limits of the Numerical Simulation of SiC Bulk and Epitaxy Growth Processes

Author:

Pons Michel1,Blanquet Elisabeth2,Dedulle Jean Marc1,Ucar M.3,Wellmann Peter J.4,Danielsson Örjan5,Ferret Pierre6,Di Cioccio Lea6,Baillet Francis7,Chaussende Didier8ORCID,Madar Roland8

Affiliation:

1. Grenoble INP–CNRS-UJF

2. Domaine Universitaire

3. NOVASIC

4. University of Erlangen-Nuremberg

5. Linköping University

6. LETI-CEA Grenoble (Technologies Avancées)

7. Laboratoire de Thermodynamique et Physico-Chimie Métallurgiques ENSEEG

8. UMR CNRS 5628, INP Grenoble-MINATEC

Abstract

Modeling and simulation of the SiC growth process is sufficiently mature to be used as a training tool for engineers as well as a decision making tool, e.g. when building new process equipment or up-scaling old ones. It is possible to simulate accurately temperature and deposition distributions, as well as doping. The key of success would be the combined use of simulation, experiments and characterization in a "daily interaction". The main limitation in SiC growth modeling is the accurate knowledge of physical, thermal, radiative, chemical and electrical data for the different components of the reactor. This is the weakest link in developing completely predictive models. In addition, the link between the thermochemical history of the grown material and its structure and defects still needs further development and input of experimental data.

Publisher

Trans Tech Publications, Ltd.

Subject

Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science

Reference14 articles.

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