Affiliation:
1. RIST Research Institute of Industrial Science and Engineering
2. The University of Tokyo
Abstract
In order to investigate the atomic structure of sputtered-deposited Fe76Tb24 amorphous film, we performed X-ray anomalous scattering (XAS) measurements at two energies near the Tb K-absorption edge using the synchrotron-radiations (SR). The total, Tb and Fe environmental pair distribution functions (PDF's) of the amorphous film were obtained from the normalized scattering intensities after the corrections for the structural analysis. The coordination numbers were calculated from the area under the fitted PDF profiles multiplied by 4πr 2 and near-neighbor distances were estimated from the positions of the peaks of the fitted profiles.
Publisher
Trans Tech Publications, Ltd.
Subject
Condensed Matter Physics,General Materials Science,Atomic and Molecular Physics, and Optics